New interferometric method to locate aspheric in the partial null aspheric testing system Conference Paper uri icon

name of conference

  • 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

published proceedings

  • 6TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT

author list (cited authors)

  • Wei, T., Liu, D., Tian, C., Zhang, L., & Yang, Y.

citation count

  • 1

complete list of authors

  • Wei, Tao||Liu, Dong||Tian, Chao||Zhang, Lei||Yang, Yongying

editor list (cited editors)

  • Zhang, Y., Xiang, L., & To, S.

publication date

  • October 2012