Ab Initio Computational Screening and Performance Assessment of van der Waals and Semimetallic Contacts to Monolayer WSe2 P-Type Field-Effect Transistors
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IEEE TRANSACTIONS ON ELECTRON DEVICES
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Yang, N., Lin, Y. C., Chuu, C., Rahman, M. S., Wu, T., Chou, A., ... Wang, H.
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Yang, Ning||Lin, Yuxuan Cosmi||Chuu, Chih-Piao||Rahman, M Saifur||Wu, Tong||Chou, Ang-Sheng||Chen, Hung-Yu||Woon, Wei-Yen||Liao, Szuya Sandy||Huang, Shengxi||Qian, Xiaofeng||Guo, Jing||Radu, Iuliana||Wong, H-S Philip||Wang, Han
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2-d Materials
Ab Initio Simulation
Analytical Models
Contact Resistance
Discrete Fourier Transforms
Field Effect Transistors
Field-effect Transistor (fet)
Metallic Materials
Metals
Moore's Law
Nanoelectronics
Tunneling
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http://dx.doi.org/10.1109/ted.2023.3241569