Gharaibeh, Ammar (2009-08). A Behavioral Model of a Built-in Current Sensor for IDDQ Testing. Master's Thesis. Thesis uri icon

abstract

  • IDDQ testing is one of the most effective methods for detecting defects in integrated circuits. Higher leakage currents in more advanced semiconductor technologies have reduced the resolution of IDDQ test. One solution is to use built-in current sensors. Several sensor techniques for measuring the current based on the magnetic field or voltage drop across the supply line have been proposed. In this work, we develop a behavioral model for a built-in current sensor measuring voltage drop and use this model to better understand sensor operation, identify the effect of different parameters on sensor resolution, and suggest design modifications to improve future sensor performance.
  • IDDQ testing is one of the most effective methods for detecting defects in integrated

    circuits. Higher leakage currents in more advanced semiconductor technologies have

    reduced the resolution of IDDQ test. One solution is to use built-in current sensors. Several

    sensor techniques for measuring the current based on the magnetic field or voltage drop

    across the supply line have been proposed. In this work, we develop a behavioral model

    for a built-in current sensor measuring voltage drop and use this model to better

    understand sensor operation, identify the effect of different parameters on sensor

    resolution, and suggest design modifications to improve future sensor performance.

publication date

  • August 2009