Enhanced ion irradiation tolerance properties in TiN/MgO nanolayer films Academic Article uri icon

abstract

  • Interface mitigation effects on ion irradiation induced damage are explored in TiN/MgO nanolayer thin films with nanolayer thickness varied from 10 nm to 50 nm. After ion irradiation with He ions to a fluence of 4 × 10 16 cm-2 at 50 keV, no hardness variation is observed in the nanolayer samples based on the nano-indentation measurement, and high resolution TEM indicates no obvious ion damage in the MgO layers in the nanolayered samples. However, single layer MgO film shows a significant hardness increase of ∼20% and high density point defect clusters (∼5 nm) are clearly identified. These results suggest that, in this system, nanolayer interfaces could act as effective point defect sinks and be responsible for the enhanced radiation tolerance properties. © 2012 Elsevier B.V. All rights reserved.

author list (cited authors)

  • Jiao, L., Chen, A., Myers, M. T., General, M. J., Shao, L., Zhang, X., & Wang, H.

citation count

  • 18

complete list of authors

  • Jiao, L||Chen, A||Myers, MT||General, MJ||Shao, L||Zhang, X||Wang, H

publication date

  • March 2013