Phase transformations in sputtered Ni-Mn-Ga magnetic shape memory alloy thin films Academic Article

abstract

• Ni-Mn-Ga magnetic shape memory alloy films have been prepared by the DC magnetron sputtering technique. As-deposited films show a quasi-amorphous structure that crystallizes at 500 K. Crystallization study using Kissinger's analysis reveals a relatively low activation energy indicating partial crystallinity in the films. In situ X-ray diffraction studies show reversible martensite phase transformations, and phase segregation to non-transforming L1 2 precipitates at higher temperatures. It was observed that the phase segregation can be suppressed by low temperature heat treatment. 2011 Elsevier B.V. All rights reserved.

authors

• Karaman, Ibrahim

published proceedings

• THIN SOLID FILMS

author list (cited authors)

• Jetta, N., Ozdemir, N., Rios, S., Bufford, D., Karaman, I., & Zhang, X.

citation count

• 19

complete list of authors

• Jetta, N||Ozdemir, N||Rios, S||Bufford, D||Karaman, I||Zhang, X

publication date

• February 2012

publisher

• Elsevier  Publisher

published in

• THIN SOLID FILMS  Journal

keywords

• In Situ X-ray Diffraction
• Magnetic Shape Memory Alloys
• NiMnGa
• Phase Segregation

Digital Object Identifier (DOI)

• 10.1016/j.tsf.2011.12.029

start page

• 3433

end page

• 3439

volume

• 520

issue

• 9

URL

• http://dx.doi.org/10.1016/j.tsf.2011.12.029