Measuring Thermal and Thermoelectric Properties of One-Dimensional Nanostructures Using a Microfabricated Device Academic Article uri icon

abstract

  • We have batch-fabricated a microdevice consisting of two adjacent symmetric silicon nitride membranes suspended by long silicon nitride beams for measuring thermophysical properties of one-dimensional nanostructures (nanotubes, nanowires, and nanobelts) bridging the two membranes. A platinum resistance heater/thermometer is fabricated on each membrane. One membrane can be Joule heated to cause heat conduction through the sample to the other membrane. Thermal conductance, electrical conductance, and Seebeck coefficient can be measured using this microdevice in the temperature range of 4400 K of an evacuated Helium cryostat. Measurement sensitivity, errors, and uncertainty are discussed. Measurement results of a 148 nm and a 10 nm-diameter single wall carbon nanotube bundle are presented.

published proceedings

  • Journal of Heat Transfer

altmetric score

  • 7.75

author list (cited authors)

  • Shi, L. i., Li, D., Yu, C., Jang, W., Kim, D., Yao, Z., Kim, P., & Majumdar, A.

citation count

  • 557

complete list of authors

  • Shi, Li||Li, Deyu||Yu, Choongho||Jang, Wanyoung||Kim, Dohyung||Yao, Zhen||Kim, Philip||Majumdar, Arunava

publication date

  • October 2003