Thermal and Thermoelectric Measurements of Low Dimensional Nanostructures Conference Paper uri icon

abstract

  • Low dimensional materials have unique thermal and thermoelectric properties that can be very different from their bulk counterparts. In a previous work, we and our collaborators have developed a microdevice for measuring thermal and thermoelectric properties of multiwall carbon nanotubes. Here, we used an improved design of the device for measuring single wall carbon nanotubes, Ge nanowires, and SnO2 nanobelts. These nanostructures are trapped between two adjacent symmetric silicon nitride membranes of the micro device using either a wet deposition method or in-situ chemical vapor deposition. The measurements provide the critically needed data of the unique thermophysical properties of these nanomaterials.

name of conference

  • ASME 2003 Heat Transfer Summer Conference

published proceedings

  • Heat Transfer: Volume 1

author list (cited authors)

  • Yu, C., Jang, W., Hanrath, T., Kim, D., Yao, Z., Korgel, B., ... Majumdar, A.

citation count

  • 8

complete list of authors

  • Yu, Choongho||Jang, Wanyoung||Hanrath, Tobias||Kim, Dohyung||Yao, Zhen||Korgel, Brian||Shi, Li||Wang, Zhong Lin||Li, Deyu||Majumdar, Arunava

publication date

  • January 2003

publisher