Thermal and thermoelectric measurements of low dimensional nanostructures Conference Paper uri icon

abstract

  • Low dimensional materials have unique thermal and thermoelectric properties that can be very different from their bulk counterparts. In a previous work, we and our collaborators have developed a microdevice for measuring thermal and thermoelectric properties of multiwall carbon nanotubes. Here, we used an improved design of the device for measuring single wall carbon nanotubes, Ge nanowires, and SnO 2 nanobelts. These nanostructures are trapped between two adjacent symmetric silicon nitride membranes of the micro device using either a wet deposition method or in-situ chemical vapor deposition. The measurements provide the critically needed data of the unique thermophysical properties of these nanomaterials.

author list (cited authors)

  • Yu, C., Jang, W., Hanrath, T., Kim, D., Yao, Z., Korgel, B., ... Majumdar, A.

publication date

  • December 2003