An improved DenseNet model to classify the damage caused by cotton aphid
-
- Overview
-
- Research
-
- Identity
-
- Additional Document Info
-
- Other
-
- View All
-
Overview
published proceedings
-
COMPUTERS AND ELECTRONICS IN AGRICULTURE
author list (cited authors)
-
Bao, W., Cheng, T., Zhou, X., Guo, W., Wang, Y., Zhang, X., Qiao, H., & Zhang, D.
citation count
publication date
publisher
Research
keywords
-
Coordinated Attention Mechanism
-
Cotton Aphid
-
Densenet
-
Severity Grading
Identity
Digital Object Identifier (DOI)
Additional Document Info
start page
end page
volume
Other
URL
-
http://dx.doi.org/10.1016/j.compag.2022.107485