Single-nanopore investigations with ion conductance microscopy. Academic Article uri icon

abstract

  • A three-electrode scanning ion conductance microscope (SICM) was used to investigate the local current-voltage properties of a single nanopore. In this experimental configuration, the response measured is a function of changes in the resistances involved in the pathways of ion migration. Single-nanopore membranes utilized in this study were prepared with an epoxy painting procedure to isolate a single nanopore from a track-etch multipore membrane. Current-voltage responses measured with the SICM probe in the vicinity of a single nanopore were investigated in detail and agreed well with equivalent circuit models proposed in this study. With this modified SICM, the current-voltage responses characterized for the case of a single cylindrical pore and a single conical pore exhibit distinct conductance properties that originate from the geometry of nanopores.

published proceedings

  • ACS Nano

author list (cited authors)

  • Chen, C., Zhou, Y. i., & Baker, L. A.

citation count

  • 43

complete list of authors

  • Chen, Chiao-Chen||Zhou, Yi||Baker, Lane A

publication date

  • October 2011