Single-nanopore investigations with ion conductance microscopy.

abstract

• A three-electrode scanning ion conductance microscope (SICM) was used to investigate the local current-voltage properties of a single nanopore. In this experimental configuration, the response measured is a function of changes in the resistances involved in the pathways of ion migration. Single-nanopore membranes utilized in this study were prepared with an epoxy painting procedure to isolate a single nanopore from a track-etch multipore membrane. Current-voltage responses measured with the SICM probe in the vicinity of a single nanopore were investigated in detail and agreed well with equivalent circuit models proposed in this study. With this modified SICM, the current-voltage responses characterized for the case of a single cylindrical pore and a single conical pore exhibit distinct conductance properties that originate from the geometry of nanopores.

authors

• Baker, Lane

published proceedings

• ACS Nano

author list (cited authors)

• Chen, C., Zhou, Y. i., & Baker, L. A.

citation count

• 43

complete list of authors

• Chen, Chiao-Chen||Zhou, Yi||Baker, Lane A

publication date

• October 2011

publisher

• American Chemical Society (ACS)  Publisher

published in

• ACS Nano  Journal

keywords

• Conductance
• Membrane And Ion Transport
• Microscopy
• Nanopore

PubMed Central ID

• 21923184

Digital Object Identifier (DOI)

• 10.1021/nn203205s

start page

• 8404

end page

• 8411

volume

• 5

issue

• 10

URL

• http://dx.doi.org/10.1021/nn203205s