Parylene insulated probes for scanning electrochemical-atomic force microscopy. Academic Article

abstract

• Scanning electrochemical-atomic force microscopy (SECM-AFM) is a powerful technique that can be used to obtain in situ information related to electrochemical phenomena at interfaces. Fabrication of probes to perform SECM-AFM experiments remains a challenge. Herein, we describe a method for formation of microelectrodes at the tip of commercial conductive AFM probes and demonstrate application of these probes to SECM-AFM. Probes were first insulated with a thin parylene layer, followed by subsequent exposure of active electrodes at the probe tips by mechanical abrasion of the insulating layer. Characterization of probes was performed by electron microscopy and cyclic voltammetry. In situ measurement of localized electrochemical activity with parylene-coated probes was demonstrated through measurement of the diffusion of Ru(NH)(6)(3+) across a porous membrane.

authors

• Baker, Lane

published proceedings

• Langmuir

author list (cited authors)

• Derylo, M. A., Morton, K. C., & Baker, L. A.

citation count

• 38
• 40

complete list of authors

• Derylo, Maksymilian A||Morton, Kirstin C||Baker, Lane A

publication date

• November 2011

publisher

• American Chemical Society (ACS)  Publisher

published in

• Langmuir  Journal

keywords

• Electrochemistry
• Microscopy, Atomic Force
• Microscopy, Electron, Scanning
• Molecular Probes
• Polymers
• Xylenes

PubMed Central ID

• 21961960

Digital Object Identifier (DOI)

• 10.1021/la203032u

start page

• 13925

end page

• 13930

volume

• 27

issue

• 22

URL

• http://dx.doi.org/10.1021/la203032u