Scanning ion conductance microscopy. Chapter uri icon

abstract

  • Scanning ion conductance microscopy (SICM) is a versatile type of scanning probe microscopy for studies in molecular biology and materials science. Recent advances in feedback and probe fabrication have greatly increased the resolution, stability, and speed of imaging. Noncontact imaging and the ability to deliver materials to localized areas have made SICM especially fruitful for studies of molecular biology, and many examples of such use have been reported. In this review, we highlight new developments in the operation of SICM and describe some of the most exciting recent studies from this growing field.

altmetric score

  • 9

author list (cited authors)

  • Chen, C., Zhou, Y. i., & Baker, L. A.

citation count

  • 178

complete list of authors

  • Chen, Chiao-Chen||Zhou, Yi||Baker, Lane A

Book Title

  • ANNUAL REVIEW OF ANALYTICAL CHEMISTRY, VOL 5

publication date

  • July 2012