A proposed route to independent measurements of tight junction conductance at discrete cell junctions. Academic Article uri icon


  • Direct recording of tight junction permeability is of pivotal importance to many biologic fields. Previous approaches bear an intrinsic disadvantage due to the difficulty of separating tight junction conductance from nearby membrane conductance. Here, we propose the design of Double whole-cell Voltage Clamp - Ion Conductance Microscopy (DVC-ICM) based on previously demonstrated potentiometric scanning of local conductive pathways. As proposed, DVC-ICM utilizes two coordinated whole-cell patch-clamps to neutralize the apical membrane current during potentiometric scanning, which in models described here will profoundly enhance the specificity of tight junction recording. Several potential pitfalls are considered, evaluated and addressed with alternative countermeasures.

published proceedings

  • Tissue Barriers

altmetric score

  • 0.5

author list (cited authors)

  • Zhou, L., Zeng, Y., Baker, L. A., & Hou, J.

citation count

  • 8

complete list of authors

  • Zhou, Lushan||Zeng, Yuhan||Baker, Lane A||Hou, Jianghui

publication date

  • October 2015