Structural and morphological data of RF-Sputtered BiVO4 thin films.

abstract

• Structural and morphological modulation of rf-sputtered BiVO4 thin films deposited using mechanochemical synthesis prepared BiVO4 nano-powders as sintered target are included in this data article. The crystalline nature of as-prepared films, namely amorphous and crystalline was acquired with time and temperature dependent in-situ high temperature X-ray diffraction (HT-XRD), at a time interval of 1h. Typical Fourier transform infrared (FT-IR) spectra of annealed thin film of monoclinic BiVO4 structure is given. Furthermore, correlation between morphologies of various substrate temperature fabricated BiVO4 thin films are presented.

authors

• Subramaniam, Velumani

published proceedings

• Data Brief

author list (cited authors)

• Venkatesan, R., Velumani, S., Ordon, K., Makowska-Janusik, M., Corbel, G., & Kassiba, A.

citation count

• 1

complete list of authors

• Venkatesan, R||Velumani, S||Ordon, K||Makowska-Janusik, M||Corbel, G||Kassiba, A

publication date

• April 2018

publisher

• Elsevier  Publisher

Digital Object Identifier (DOI)

• 10.1016/j.dib.2018.01.070

start page

• 526

end page

• 528

volume

• 17

URL

• http://dx.doi.org/10.1016/j.dib.2018.01.070