Effects of changes on temperature and fluorine concentration in the structural, optical and electrical properties of SnO2 :F thin films
Academic Article
Overview
Research
Identity
Additional Document Info
Other
View All
Overview
published proceedings
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
author list (cited authors)
Miranda, H., Velumani, S., Samudio Perez, C. A., Krause, J. C., D'Souza, F., De Obaldia, E., & Ching-Prado, E.
citation count
complete list of authors
Miranda, H||Velumani, S||Samudio Perez, CA||Krause, JC||D'Souza, Francis||De Obaldia, Elida||Ching-Prado, E
publication date
publisher
Research
keywords
40 Engineering
4016 Materials Engineering
Identity
Digital Object Identifier (DOI)
Additional Document Info
start page
end page
volume
issue
Other
URL
http://dx.doi.org/10.1007/s10854-019-01933-6