Statistical experimental design to optimize RF-sputtered NiTiO3 thin films
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published proceedings
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JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
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Bellam, J. B., Jouanneaux, A., Subramaniam, V., & Kassiba, A. H.
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40 Engineering
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4016 Materials Engineering
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http://dx.doi.org/10.1007/s10854-020-02940-8