Spectroscopic ellipsometry (SE) studies on vacuum-evaporated ZnSe thin films Academic Article

authors

• Subramaniam, Velumani

published proceedings

• MATERIALS CHARACTERIZATION

author list (cited authors)

• Venkatachalam, S., Soundararajan, D., Peranantham, P., Mangalaraj, D., Narayandass, S. K., Velumani, S., & Schabes-Retchkiman, P.

citation count

• 4

complete list of authors

• Venkatachalam, S||Soundararajan, D||Peranantham, P||Mangalaraj, D||Narayandass, Sa K||Velumani, S||Schabes-Retchkiman, P

publication date

• January 2007

publisher

• Elsevier  Publisher

published in

• Materials Characterization  Journal

keywords

• Composition
• I-v
• Spectroscopic Ellipsometry
• Structure
• Thin Films

Digital Object Identifier (DOI)

• 10.1016/j.matchar.2006.11.026

start page

• 715

end page

• 720

volume

• 58

issue

• 8-9

URL

• http://dx.doi.org/10.1016/j.matchar.2006.11.026