Electrochemical growth and characterization of iron doped cadmium sulfide thin films Academic Article

authors

• Subramaniam, Velumani

published proceedings

• MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

author list (cited authors)

• Thanikaikarasan, S., Mahalingam, T., Raja, M., & Velumani, S.

citation count

• 17

complete list of authors

• Thanikaikarasan, S||Mahalingam, T||Raja, M||Velumani, S

publication date

• January 2015

publisher

• Elsevier  Publisher

published in

• Materials Science in Semiconductor Processing  Journal

keywords

• Cds:fe
• Linear Sweep Voltammetry
• Microstructural Parameters
• Refractive Index
• Stylus Profilometry
• Thin Films

Digital Object Identifier (DOI)

• 10.1016/j.mssp.2015.03.017

start page

• 215

end page

• 222

volume

• 37

URL

• http://dx.doi.org/10.1016/j.mssp.2015.03.017