Effects of interface trap density on the electrical performance of amorphous InSnZnO thin-film transistor uri icon

published proceedings

  • JOURNAL OF SEMICONDUCTORS

author list (cited authors)

  • Liang, Y., Jang, K., Velumani, S., Nguyen, C., & Yi, J.

citation count

  • 9

complete list of authors

  • Liang, Yongye||Jang, Kyungsoo||Velumani, S||Nguyen, Cam Phu Thi||Yi, Junsin

publication date

  • January 2015