Effects of interface trap density on the electrical performance of amorphous InSnZnO thin-film transistor
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Overview
published proceedings
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JOURNAL OF SEMICONDUCTORS
author list (cited authors)
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Liang, Y., Jang, K., Velumani, S., Nguyen, C., & Yi, J.
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Liang, Yongye||Jang, Kyungsoo||Velumani, S||Nguyen, Cam Phu Thi||Yi, Junsin
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Research
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A-itzo Tfts
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Electrical Properties
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Electrical Stability
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Interface Trap Density
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Low Resistivity
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http://dx.doi.org/10.1088/1674-4926/36/2/024007