Aging effects on the stability of nitrogen-doped, and un-doped InGaZnO thin-film transistors Academic Article

authors

• Subramaniam, Velumani

published proceedings

• MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

author list (cited authors)

• Raja, J., Jang, K., Balaji, N., Hussain, S. Q., Velumani, S., Chatterjee, S., Kim, T., & Yi, J.

citation count

• 22

complete list of authors

• Raja, Jayapal||Jang, Kyungsoo||Balaji, Nagarajan||Hussain, Shahzada Qamar||Velumani, S||Chatterjee, Somenath||Kim, Taeyong||Yi, Junsin

publication date

• January 2015

publisher

• Elsevier  Publisher

published in

• Materials Science in Semiconductor Processing  Journal

keywords

• Ingazno
• Moisture Adsorption
• Oxygen Desorption
• Shelf-life Stability

Digital Object Identifier (DOI)

• 10.1016/j.mssp.2015.02.036

start page

• 129

end page

• 134

volume

• 37

URL

• http://dx.doi.org/10.1016/j.mssp.2015.02.036