Critical Vertex Identification and Suppression Strategies of Excess Carrying Failure Academic Article

authors

• Huang, Tingwen

published proceedings

• IEEE Systems Journal

author list (cited authors)

• Sun, Y., Yang, D., Qin, J., Huang, T., & Meng, L.

complete list of authors

• Sun, Yunhe||Yang, Dongsheng||Qin, Jia||Huang, Tingwen||Meng, Lei

publication date

• October 2022

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Systems Journal  Journal

Digital Object Identifier (DOI)

• 10.1109/jsyst.2022.3210193

start page

• 5856

end page

• 5867

volume

• 16

issue

• 4