Memristive Device Characteristics Engineering by Controlling the Crystallinity of Switching Layer Materials Academic Article

authors

• Krishnamoorthy, Aravind

published proceedings

• ACS APPLIED ELECTRONIC MATERIALS

author list (cited authors)

• Yang, H., Chen, B., Song, B., Meng, D., Tiwari, S., Krishnamoorthy, A., ... Wu, W.

citation count

• 5

complete list of authors

• Yang, Hao||Chen, Buyun||Song, Boxiang||Meng, Deming||Tiwari, Subodh||Krishnamoorthy, Aravind||Yan, Xiaodong||Liu, Zerui||Wang, Yunxiang||Hu, Pan||Ou, Tse-Hsien||Branicio, Paulo||Kalia, Rajiv||Nakano, Aiichiro||Vashishta, Priya||Liu, Fanxin||Wang, Han||Wu, Wei

publication date

• June 2020

publisher

• American Chemical Society (ACS)  Publisher

published in

• ACS Applied Electronic Materials  Journal

keywords

• Atomic Layer Deposition
• Crystallinity
• Memristive Device
• Memristor
• Reram

Digital Object Identifier (DOI)

• 10.1021/acsaelm.0c00148

start page

• 1529

end page

• 1537

volume

• 2

issue

• 6

URL

• http://dx.doi.org/10.1021/acsaelm.0c00148