Vulnerable Line Identification of Cascading Failure in Power Grid Based on New Electrical Betweenness Academic Article

authors

• Huang, Tingwen

published proceedings

• IEEE Transactions on Circuits & Systems II Express Briefs

author list (cited authors)

• Chen, C., Zhou, Y., Wang, Y., Ding, L. i., & Huang, T.

complete list of authors

• Chen, Chao-Yang||Zhou, Yong||Wang, Yanwu||Ding, Li||Huang, Tingwen

publication date

• October 2022

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Transactions on Circuits and Systems, Part 2: Express Briefs  Journal

Digital Object Identifier (DOI)

• 10.1109/tcsii.2022.3213552

start page

• 1

end page

• 1

volume

• PP

issue

• 99