On-chip spectrum analyzer for built-in testing analog ICS Conference Paper

abstract

• An on-chip spectrum analyzer using switched-capacitor techniques is described. This system is used for built-in testing analog circuits. The main property of the proposed architecture is its inherent synchronization, which facilitates the testing task saving time, power and silicon area. Simulations and breadboard results are presented in order to verify the main principles. The resolution of the on-chip spectrum analyzer is limited to 8 bits.

authors

• Silva-Martinez, Jose

published proceedings

• 2002 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL V, PROCEEDINGS

author list (cited authors)

• Mendez-Rivera, M., Silva-Martinez, J., & Sanchez-Sinencio, E.

complete list of authors

• Mendez-Rivera, M||Silva-Martinez, J||Sanchez-Sinencio, E

publication date

• January 2002

publisher

• IEEE  Publisher

published in

• IEEE International Symposium on Circuits and Systems  Journal

International Standard Book Number (ISBN) 10

• 0-7803-7448-7

start page

• 61

end page

• 64

volume

• 5

URL

• http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7897