Light Sensing of a-Si:H p-i-n Diode-Mechanism of Asymmetric Charge Carrier Transfer

authors

• Kuo, Yue

published proceedings

• IEEE SENSORS LETTERS

author list (cited authors)

• Kim, K., & Kuo, Y.

citation count

• 1

publication date

• February 2017

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

keywords

• And Asymmetric Carrier Loss
• Defect Density
• Electromagnetic Wave Sensors A-si:h Pin Diode
• I-layer Thickness

Digital Object Identifier (DOI)

• 10.1109/LSENS.2017.2682701

start page

• 1

end page

• 4

volume

• 1

issue

• 1

URL

• http://dx.doi.org/10.1109/lsens.2017.2682701