Reflectivity characterization of various black and white materials
Conference Paper
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- Overview
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- Research
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- Identity
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- Additional Document Info
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Overview
name of conference
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Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation V
published proceedings
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ADVANCES IN OPTICAL AND MECHANICAL TECHNOLOGIES FOR TELESCOPES AND INSTRUMENTATION V
author list (cited authors)
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Schmidt, L. M., Conway, B., DePoy, D. L., Marshall, J. L., & Oelkers, R. J.
citation count
complete list of authors
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Schmidt, Luke M||Conway, Brant||DePoy, Darren L||Marshall, Jennifer L||Oelkers, Ryan J
editor list (cited editors)
publication date
publisher
published in
Research
keywords
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Black Materials
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Calibration Screens
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Infrared Instrumentation
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Optical Instrumentation
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Reflectivity
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Scattered Light
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Stray Light
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White Materials
Identity
Digital Object Identifier (DOI)
International Standard Book Number (ISBN) 13
Additional Document Info
Other
URL
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http://dx.doi.org/10.1117/12.2630244