Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism Academic Article

authors

• Smith, Scott

published proceedings

• JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

author list (cited authors)

• Sparkman, B., Smith, S. C., & Di, J.

citation count

• 2

complete list of authors

• Sparkman, Brett||Smith, Scott C||Di, Jia

publication date

• January 2022

publisher

• Springer Nature  Publisher

published in

• Journal of Electronic Testing  Journal

keywords

• Asynchronous Logic
• Built-in Self-test (bist)
• Multi-threshold Null Convention Logic (mtncl)
• Null Convention Logic (ncl)
• Sleep Convention Logic (scl)

Digital Object Identifier (DOI)

• 10.1007/s10836-022-06007-w

start page

• 321

end page

• 334

volume

• 38

issue

• 3

URL

• http://dx.doi.org/10.1007/s10836-022-06007-w