Assessment of the levels of damage caused by Fusarium head blight in wheat using an improved YoloV5 method Academic Article

authors

• Zhou, Xin-Gen

published proceedings

• COMPUTERS AND ELECTRONICS IN AGRICULTURE

author list (cited authors)

• Zhang, D., Luo, H., Wang, D., Zhou, X., Li, W., Gu, C., Zhang, G., & He, F.

citation count

• 15

complete list of authors

• Zhang, Dong-Yan||Luo, Han-Sen||Wang, Dao-Yong||Zhou, Xin-Gen||Li, Wei-Feng||Gu, Chun-Yan||Zhang, Gan||He, Fang-Ming

publication date

• July 2022

publisher

• Elsevier  Publisher

published in

• Computers and Electronics in Agriculture  Journal

keywords

• Diou
• Fusarium Head Blight
• Image Segmentation
• Wheat
• Wheat Ear Counting
• Yolov5

Digital Object Identifier (DOI)

• 10.1016/j.compag.2022.107086

start page

• 107086

end page

• 107086

volume

• 198

URL

• http://dx.doi.org/10.1016/j.compag.2022.107086