Explainable AI-infused ultrasonic inspection for internal defect detection
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Karthikeyan, A., Tiwari, A., Zhong, Y., & Bukkapatnam, S.
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Karthikeyan, Adithyaa||Tiwari, Akash||Zhong, Yuhao||Bukkapatnam, Satish TS
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http://dx.doi.org/10.1016/j.cirp.2022.04.036