Analytical and experimental study of mismatch strain-induced microcantilever behavior during deposition
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JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY
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Kim, Sang-Hyun||Boyd, James G
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Atomic Force Microscope
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Beam Deflection
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Mismatch Strain
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Multilayer Microcantilever
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Nickel Electroplating
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http://dx.doi.org/10.1007/bf02916302