Reliability of Candidate Photovoltaic Module-Integrated-Inverter Topologies Conference Paper

abstract

• This paper examines the reliability of candidate topologies for a PV module-integrated inverter (MII). A new approach to calculate the mean time between failure (MTBF) using the MIL-HDBK-217 stress factor method is proposed. The new approach takes in consideration the usage model of the inverter, the statistical distribution of expected operating temperature and power processed, rather than a single (typically worst-case) operating point. The technique is applied to the systematic reliability comparative study for six different inverter topologies. This study shows the impact of each component on the inverter's reliability, in particular, the power decoupling capacitors. 2012 IEEE.

name of conference

• 2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC)

authors

• Balog, Robert

published proceedings

• 2012 TWENTY-SEVENTH ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC)

author list (cited authors)

• Harb, S., & Balog, R. S.

citation count

• 19

complete list of authors

• Harb, Souhib||Balog, Robert S

publication date

• February 2012

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• n1048-2334ISSN  Journal

keywords

• Micro-inverter
• Mil- Hdbk-217
• Photovoltaic
• Power Decoupling
• Reliability
• Single-phase Inverter

Digital Object Identifier (DOI)

• 10.1109/apec.2012.6165925

International Standard Book Number (ISBN) 13

• 9781457712159

start page

• 898

end page

• 903

volume

• 1

URL

• http://dx.doi.org/10.1109/apec.2012.6165925