Noise and Information in Nanoelectronics, Sensors, and Standards 2-4 June 2003, Santa Fe, New Mexico, USA
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Overview
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Kish, L. B., Green, F., Iannaccone, G., & Vig, J. R.
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International Standard Book Number (ISBN) 10
International Standard Book Number (ISBN) 13
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https://spie.org/Publications/Proceedings/Volume/5115