LOW-VOLTAGE, HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY - A NEW CHARACTERIZATION TECHNIQUE FOR POLYMER MORPHOLOGY
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VEZIE, D. L., THOMAS, E. L., & ADAMS, W. W.
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VEZIE, DL||THOMAS, EL||ADAMS, WW
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Contrast Mechanisms
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Low-voltage Hrsem
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Morphology
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http://dx.doi.org/10.1016/0032-3861(95)90923-p