Focused Ion Beam Enabled Analysis of Nanocomposite and Nanostructured Soft Materials Academic Article

abstract

• Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 August 3, 2005

authors

• Thomas, Edwin

published proceedings

• Microscopy and Microanalysis

author list (cited authors)

• Kooi, .., Jang, J., Ullal, C., & Thomas, E. L.

citation count

• 0

complete list of authors

• Jang, J-H||Ullal, C||Thomas, EL

publication date

• August 2006

publisher

• Oxford University Press (OUP)  Publisher

published in

• Microscopy and Microanalysis  Journal

keywords

• 40 Engineering
• 4016 Materials Engineering

Digital Object Identifier (DOI)

• 10.1017/s1431927606067171

start page

• 1264

end page

• 1265

volume

• 12

issue

• S02

URL

• http://dx.doi.org/10.1017/s1431927606067171