Probing the Unique Radiation Damage Response of Oxide Interfaces Using Multi-modal STEM Imaging, Diffraction, and Spectroscopy Academic Article uri icon

published proceedings

  • Microscopy and Microanalysis

author list (cited authors)

  • Spurgeon, S., Matthews, B., Kaspar, T., Jiang, W., Gigax, J., Shao, L., Shutthanandan, V., & Sassi, M.

complete list of authors

  • Spurgeon, Steven||Matthews, Bethany||Kaspar, Tiffany||Jiang, Weilin||Gigax, Jonathan||Shao, Lin||Shutthanandan, Vaithiyalingam||Sassi, Michel

publication date

  • July 2020