Advanced phasemeter for deep phase modulation interferometry. Academic Article uri icon


  • We present the development of an advanced phasemeter for the deep phase modulation interferometry technique. This technique aims for precise length measurements with a high dynamic range using little optical hardware. The advanced phasemeter uses fast ADCs and an FPGA to implement a design of multiple single-bin Fourier transforms running at high sampling rates. Non-linear noise sources in the design were analyzed and suppressed. A null measurement with an optical beatnote signal using = 1064nm was conducted. It showed a sensitivity of 0.8rad/Hz below 10Hz and 13.3rad/Hz above, with a large dynamic range. The shown performance could enable the measuring of optical path lengths with sensitivities down to 0.14pm/Hz and 2.3pm/Hz, respectively, over several fringes in an interferometric setup.

published proceedings

  • Opt Express

altmetric score

  • 9

author list (cited authors)

  • Schwarze, T. S., Gerberding, O., Cervantes, F. G., Heinzel, G., & Danzmann, K.

citation count

  • 10

publication date

  • July 2014