Enhanced Normalized Mutual Information for Localization in Noisy Environments Conference Paper

name of conference

• 2020 IEEE Applied Signal Processing Conference (ASPCON)

authors

• Chamberland-Tremblay, Jean-Francois

published proceedings

• 2020 IEEE Applied Signal Processing Conference (ASPCON)

author list (cited authors)

• Flanagan, S. T., Khublani, D. K., Chamberland, J., Agarwal, S., & Vora, A.

citation count

• 0

complete list of authors

• Flanagan, Samuel Todd||Khublani, Drupad K||Chamberland, J-F||Agarwal, Siddharth||Vora, Ankit

publication date

• January 2020

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/aspcon49795.2020.9276658

start page

• 178

end page

• 182

volume

• 00

URL

• http://dx.doi.org/10.1109/aspcon49795.2020.9276658