The Effect of Radiation Damage on the Charge Collection Efficiency of Silicon Avalanche Photodiodes
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Overview
published proceedings
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE
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Zedric, R. M., Marianno, C. M., Chirayath, S. S., Diawara, Y., & Darby, I.
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Research
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Avalanche Photodiode (apd)
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Displacement Damage
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Ion Beam Induced Charge (ibic) Technique
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http://dx.doi.org/10.1109/tns.2021.3137476