A Computational Model for Aging Dependability in Polymeric Cable Insulation Conference Paper

name of conference

• IECON 2021 47th Annual Conference of the IEEE Industrial Electronics Society

authors

• Abu-Rub, Haitham
• Toliyat, Hamid

published proceedings

• IECON 2021 - 47TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY

author list (cited authors)

• Khan, Q., Refaat, S. S., Abu-Rub, H., & Toliyat, H. A.

citation count

• 0

complete list of authors

• Khan, Qasim||Refaat, Shady S||Abu-Rub, Haitham||Toliyat, Hamid A

publication date

• October 2021

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• n1553-572XISSN  Journal

keywords

• Aging
• Electric Stress
• Multiple Variable Regression Analysis
• Power Cable
• Xlpe Insulation

Digital Object Identifier (DOI)

• 10.1109/IECON48115.2021.9589105

International Standard Book Number (ISBN) 13

• 978-1-6654-3554-3

start page

• 1

end page

• 5

volume

• 00

URL

• http://dx.doi.org/10.1109/iecon48115.2021.9589105