Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting Academic Article

authors

• Needleman, Alan

published proceedings

• Microscopy and Microanalysis

author list (cited authors)

• Diercks, D. R., Kaufman, M. J., & Needleman, A.

complete list of authors

• Diercks, DR||Kaufman, MJ||Needleman, A

publication date

• 2008

publisher

• Cambridge University Press  Publisher

published in

• Microscopy and Microanalysis  Journal

start page

• 850

end page

• 851

volume

• 14

issue

• S2