Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting Academic Article uri icon

published proceedings

  • Microscopy and Microanalysis

author list (cited authors)

  • Diercks, D. R., Kaufman, M. J., & Needleman, A

complete list of authors

  • Diercks, DR||Kaufman, MJ||Needleman, A

publication date

  • January 1, 2019 11:11 AM