Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting
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Overview
published proceedings
- Microscopy and Microanalysis
author list (cited authors)
- Diercks, D. R., Kaufman, M. J., & Needleman, A.
complete list of authors
- Diercks, DR||Kaufman, MJ||Needleman, A
publication date
- 2008
publisher
- Cambridge University Press Publisher
published in
- Microscopy and Microanalysis Journal