The connection between plasmon decay dynamics and the surface enhanced Raman spectroscopy background: Inelastic scattering from non-thermal and hot carriers
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JOURNAL OF APPLIED PHYSICS
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Wu, S., Cheng, O., Zhao, B., Hogan, N., Lee, A., Son, D. H., & Sheldon, M.
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Wu, Shengxiang||Cheng, Oscar Hsu-Cheng||Zhao, Boqin||Hogan, Nicki||Lee, Annika||Son, Dong Hee||Sheldon, Matthew
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http://dx.doi.org/10.1063/5.0032763