In-operando synchronous time-multiplexed O K-edge x-ray absorption spectromicroscopy of functioning tantalum oxide memristors
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Overview
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Kumar, S., Graves, C. E., Strachan, J. P., Kilcoyne, A., Tyliszczak, T., Nishi, Y., & Williams, R. S.
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Kumar, Suhas||Graves, Catherine E||Strachan, John Paul||Kilcoyne, AL David||Tyliszczak, Tolek||Nishi, Yoshio||Williams, R Stanley
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40 Engineering
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4016 Materials Engineering
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51 Physical Sciences
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