Multilayer graphene, Moir patterns, grain boundaries and defects identified by scanning tunneling microscopy on the m-plane, non-polar surface of SiC Institutional Repository Document uri icon

altmetric score

  • 0.25

author list (cited authors)

  • Xu, P., Qi, D., Schoelz, J. K., Thompson, J., Thibado, P. M., Wheeler, V. D., ... Peeters, F. M.

complete list of authors

  • Xu, P||Qi, D||Schoelz, JK||Thompson, J||Thibado, PM||Wheeler, VD||Nyakiti, LO||Myers-Ward, RL||Eddy, CR||Gaskill, DK||Neek-Amal, M||Peeters, FM

Book Title

  • arXiv

publication date

  • January 2014