Multilayer graphene, Moir patterns, grain boundaries and defects identified by scanning tunneling microscopy on the m-plane, non-polar surface of SiC Institutional Repository Document uri icon

author list (cited authors)

  • Xu, P., Qi, D., Schoelz, J. K., Thompson, J., Thibado, P. M., Wheeler, V. D., ... Peeters, F. M.

Book Title

  • arXiv

publication date

  • January 1, 2014 11:11 AM