A Graph-Theoretic Approach for Spatial Filtering and Its Impact on Mixed-Type Spatial Pattern Recognition in Wafer Bin Maps
Academic Article
-
- Overview
-
- Research
-
- Identity
-
- Additional Document Info
-
- View All
-
Overview
published proceedings
-
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
altmetric score
author list (cited authors)
-
Ezzat, A. A., Liu, S., Hochbaum, D. S., & Ding, Y. u.
citation count
complete list of authors
-
Ezzat, Ahmed Aziz||Liu, Sheng||Hochbaum, Dorit S||Ding, Yu
publication date
publisher
published in
Research
keywords
-
Clustering
-
Graph Theory
-
Mixture Models
-
Pattern Recognition
-
Production
-
Semiconductor Device Modeling
-
Shape
-
Spatial Data Science
-
Systematics
-
Task Analysis
-
Unsupervised Learning
-
Wafer Bin Maps
Identity
Digital Object Identifier (DOI)
Additional Document Info
start page
end page
volume
issue