Novel Fault Location for High Permeability Active Distribution Networks Based on Improved VMD and S-transform Academic Article

authors

• Lu, Mi

published proceedings

• IEEE ACCESS

author list (cited authors)

• Xu, Y., Zhao, C., Xie, S., & Lu, M. i.

citation count

• 8

complete list of authors

• Xu, Yanchun||Zhao, Caicai||Xie, Shasha||Lu, Mi

publication date

• January 2021

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Access  Journal

keywords

• Active Distribution Network
• Active Distribution Networks
• Fault Location
• Fault Traveling Wave
• Improved Variational Mode Decomposition (ivmd)
• Licenses
• Mathematical Model
• S-transform
• Signal Resolution
• Time-frequency Analysis
• Wavelet Transforms

Digital Object Identifier (DOI)

• 10.1109/ACCESS.2021.3052349

start page

• 17662

end page

• 17671

volume

• 9

URL

• http://dx.doi.org/10.1109/access.2021.3052349