HREM of Epitaxial YBa2Cu3O7 Thin Films Academic Article uri icon

abstract

  • AbstractThin films of YBa2Cu3O7 have been prepared by evaporation of Cu, Y and BaF2 onto (001) SrTiO3, LaGaO3. and LaAlO3 and subsequent annealing. Their microstructures have been examined by HREM of cross-sectional specimens. Epitaxial (001) grains of YBa2Cu3O7 form near the substrate interface in thin films but (001) and (010) grains tend to nucleate as the film thickens. 90 grain boundaries are therefore common, as well as other defects such as small-angle boundaries, dislocations and stacking faults. HREM of the substrate/superconductor interface indicates regions of perfect epitaxy, highly distorted areas, amorphous regions and areas showing evidence of interdiffusion. The relationship of these microstructural features to critical current density is discussed.

published proceedings

  • MRS Advances

author list (cited authors)

  • Mitchell, T. E., Basu, S. N., Nastasi, M., & Roy, T.

citation count

  • 9

complete list of authors

  • Mitchell, TE||Basu, SN||Nastasi, M||Roy, T

publication date

  • January 1990