Exploiting chromatic aberration to spectrally encode depth in reflectance confocal microscopy Conference Paper

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name of conference

Advanced Microscopy Techniques II

authors

Maitland, Kristen

published proceedings

Advanced Microscopy Techniques II

author list (cited authors)

Carrasco-Zevallos, O., Shelton, R. L., Olsovsky, C., Saldua, M., Applegate, B. E., & Maitland, K. C.

citation count

0

complete list of authors

Carrasco-Zevallos, Oscar||Shelton, Ryan L||Olsovsky, Cory||Saldua, Meagan||Applegate, Brian E||Maitland, Kristen C

publication date

January 2011

publisher

Optica Publishing Group Publisher