Characterization of Helium Ion Implantation Damage in Metallic Multilayers Academic Article

abstract

• Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 August 5, 2010.

authors

• Nastasi, Michael

published proceedings

• Microscopy and Microanalysis

author list (cited authors)

• Misra, A., Bhattacharyya, D., Wei, Q., & Nastasi, M.

citation count

• 0

complete list of authors

• Misra, A||Bhattacharyya, D||Wei, Q||Nastasi, M

publication date

• July 2010

publisher

• Oxford University Press (OUP)  Publisher

published in

• Microscopy and Microanalysis  Journal

Digital Object Identifier (DOI)

• 10.1017/s1431927610055510

start page

• 1594

end page

• 1595

volume

• 16

issue

• S2

URL

• http://dx.doi.org/10.1017/s1431927610055510