Assessment of subsurface damage in polished IIVI semiconductors by ion channeling
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Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
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Lucca, D. A., Wetteland, C. J., Misra, A., Klopfstein, M. J., Nastasi, M., Maggiore, C. J., & Tesmer, J. R.
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Lucca, DA||Wetteland, CJ||Misra, A||Klopfstein, MJ||Nastasi, M||Maggiore, CJ||Tesmer, JR
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http://dx.doi.org/10.1016/j.nimb.2004.01.129