Comparison of thermally and mechanically induced Si layer transfer in hydrogen-implanted Si wafers
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Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
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Hchbauer, T., Misra, A., Nastasi, M., Henttinen, K., Suni, T., Suni, I., Lau, S. S., & Ensinger, W.
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Höchbauer, T||Misra, A||Nastasi, M||Henttinen, K||Suni, T||Suni, I||Lau, SS||Ensinger, W
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http://dx.doi.org/10.1016/j.nimb.2003.11.043