Variation of structural, electrical, and optical properties of Zn1xMgxO thin films Academic Article

abstract

• Zn 1 x Mg x O thin films on (001) sapphire substrates were deposited using pulsed laser deposition. As the substrate temperature increased, the Mg content in the Zn1xMgxO thin films increased and the photoluminescence (PL) peak position of the Zn1xMgxO thin films shifted from 370to356nm, indicating a band gap expansion. Variations of the structural, electrical, and optical properties of Zn1xMgO thin films have been observed and analyzed by x-ray diffraction, Hall measurements, and PL measurements.

authors

• Nastasi, Michael

published proceedings

• Journal of Applied Physics

author list (cited authors)

• Kim, J. W., Kang, H. S., Kim, J. H., Lee, S. Y., Lee, J., & Nastasi, M.

citation count

• 43

publication date

• August 2006

publisher

• AIP Publishing  Publisher

keywords

• 40 Engineering
• 4018 Nanotechnology

Digital Object Identifier (DOI)

• 10.1063/1.2219153

start page

• 033701

volume

• 100

issue

• 3

URL

• http://dx.doi.org/10.1063/1.2219153